Santec 的全新 TSL-570 充分利用了 Santec 在可调谐激光器制造方面 33 年的经验。TSL-570 是一种高性能可调谐激光器,具有宽调谐范围和结合高功率和高信噪比的输出。它采用全新的光学腔体设计,具有高达 200 nm/s 的精确速度控制和亚皮米级分辨率和精度。
可调谐激光器广泛用于光子学;用于光学元件表征、光子集成电路测试、量子光子学、光谱学和传感器。
Santec 的 TSL-570 是一款适用于所有应用的高规格、全功能仪器。它具有简单易用的触摸屏显示器以及用于远程控制的以太网、GPIB 和 USB 接口。局域网唤醒 (WoL) 功能为远程安装提供了便利。型号可覆盖 1240 至 1640 nm,输出功率高达 20 mW。
新的密封激光腔是无跳模的,并在每个波长提供稳定的输出。它具有 0.1 pm 分辨率、亚 pm 精度和市场领先的 90 dB/0.1 nm 超低水平自发源发射。TSL-570 与 Santec 的光功率计(MPM 系列)、光开关(OSU 系列)和偏振控制器(PCU 系列)无缝集成,为波长相关损耗 (WDL) 和偏振相关损耗 (PDL) 创建基准、交钥匙解决方案测量(扫描测试系统)。
输出功率
+ 13 dBm
信噪比
90 dB/0.1 nm
波长精度
- A 型:±20 pm 波长精度 /C 型:±5 pm 波长精度 /P 型:±2 pm 波长精度
输出功率
+ 13 dBm
信噪比
90 dB/0.1 nm
波长精度
- A 型:±20 pm 波长精度 /C 型:±5 pm 波长精度 /P 型:±2 pm 波长精度
应用
组件和模块的光学特性:可调谐滤波器、交织器、光纤布拉格光栅、耦合器、分路器、隔离器、开关等 /WSS 和波长阻断器 /DWDM 组件
硅光子波导表征,包括微腔环形谐振器
光谱学
干涉测量法
Santec’s new TSL-570 takes full advantage of Santec’s 33 years of experience in the manufacture of tunable lasers. TSL-570 is a high-performance tunable laser with a wide tuning range and an output that combines high power and high signal-to-noise ratio. It adopts a new optical cavity design with precise speed control up to 200 nm/s and sub-picimeter resolution and accuracy.
Tunable lasers are widely used in photonics; used in optical component characterization, photonic integrated circuit testing, quantum photonics, spectroscopy, and sensors.
Santec's TSL-570 is a high specification, full-featured instrument suitable for all applications. It has an easy-to-use touch screen display and Ethernet, GPIB and USB interfaces for remote control. The Wake-on-LAN (WoL) function facilitates remote installation. Models can cover 1240 to 1640 nm and output power up to 20 mW.
The new sealed laser cavity is mode-hop-free and provides stable output at every wavelength. It has 0.1 pm resolution, sub pm accuracy and market-leading 90 dB/0.1 nm ultra-low level spontaneous source emission. TSL-570 is seamlessly integrated with Santec’s optical power meters (MPM series), optical switches (OSU series) and polarization controllers (PCU series) to create benchmarks and cross-references for wavelength-dependent loss (WDL) and polarization-dependent loss (PDL). Key solution measurement (scanning test system).
200 nm/s fast scan
Excellent accuracy (+/- 2 pm) and resolution (0.1 pm)
Sealed cavity to ensure the stability of each wavelength
Multiple wavelength options from 1240 to 1640 nm
Output power
+ 13 dBm
Signal to noise ratio
90 dB/0.1 nm
Wavelength accuracy
-A type: ±20 pm wavelength accuracy / C type: ±5 pm wavelength accuracy / P type: ±2 pm wavelength accuracy
Optical characteristics of components and modules: tunable filters, interleavers,
fiber Bragg gratings, couplers, splitters, isolators, switches, etc./WSS and wavelength blockers /DWDM components
Characterization of silicon photonic waveguides, including microcavity ring resonators
Spectroscopy
Interferometry